XJTAG can reach them and helps us test a high proportion of each board quickly and efficiently.”Įngineers can write tests easily in XJTAG’s system using high-level instructions, without spending time learning the finer points of boundary scan such as how to construct low-level test vectors. “There are often connections that cannot be probed. In this way, XJTAG can test connections that are untestable using other techniques.Įutron has invested in the XJTAG system for this very reason, as Test Engineer Luca Gherardi explains, “We are using XJTAG to test processing modules that contain a combination of DDR and flash memory chips, FPGAs, logic devices, various encoders, and off-board interfaces such as RS-232 and CAN transceivers,” he says.
The XJTAG boundary scan test system can also control the I/O pins of non-JTAG devices that are on the same nets as devices connected to the scan chain. Components that contain internal boundary scan circuitry, however, can be tested without direct probing. Component packages such as BGAs, flip-chip CSPs, and LGAs have I/O pins that are difficult or impossible to access with test probes, while space for test points is always needed either for other components or to be removed to save space. Hardware designers everywhere know that pushing the limits of functionality can often compromise testability. All assemblies must be built and tested to high standards, for deployment in challenging environments such as smart factories, smart cities, and smart infrastructure. With extensive competencies for building the “intelligent world”, the organisation’s technical skills include hardware and software design, and state-of-the-art manufacturing. The intuitive user interface lets engineers test parts of their boards that can not be reached any other way, effectively testing the untestable.Įutron is an electronic manufacturing services and solutions (EMS2) company headquartered outside Bergamo, northern Italy. Eutron chose XJTAG boundary scan to raise coverage to the level required. Lack of access to I/O pins can challenge the test coverage achievable using probes alone. XJDirect - Programming on-chip flash in your processor.
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